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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 41325-2022 |
Low-density crystal primary pit silicon single crystal polishing wafer for integrated circuits {译} 集成电路用低密度晶体原生凹坑硅单晶抛光片 |
China National Standards Low density crystal |
 English PDF |
| GB/T 34481-2017 |
Test method for measuring etch pit density (EPD) in low dislocation density monocrystalline germanium slices 低位错密度锗单晶片腐蚀坑密度(EPD)的测量方法 |
China National Standards Low density crystal |
English PDF |
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