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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 40129-2021 |
Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer 表面化学分析 二次离子质谱 飞行时间二次离子质谱仪质量标校准 |
China National Standards analysis—Secondary |
 English PDF |
| GB/T 32495-2016 |
Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon 表面化学分析 二次离子质谱 硅中砷的深度剖析方法 |
China National Standards analysis—Secondary |
English PDF |
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