China 'GB/T 4937.38-2025
' standard english version:
NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 4937.38-2025
Semiconductor Devices - Methods of Mechanical and Climatic Testing - Part 38: Soft Errors Test Method for Semiconductor Devices with Memory 半导体器件 - 机械和气候试验方法 - 第38部分:带存储的半导体器件的软错误试验方法
Issued Date:2025/12/2
Implemented Date:2026/7/1
Issued by:
The Standardization Administration of the People's Republic of China