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 China "GB/T 22319.7-2015" standard english version information:

1. China GB/T 22319.7-2015 Standard Chinese version, you can purchase directly online; After receive your payment, we will send the GB Standards PDF file to your Email within 24 Hr.
2. China GB/T 22319.7-2015 Standard English version is not ready-made,only after get your order, then we translate them, time usually need 3-5 days. Detail refere: "How to purchase the English version China GB Standards?"
Item Content
GB Standard  Code GB/T 22319.7-2015
GB Standard Class China National Standard
GB Standard English Title Measurement of quartz crystal unit parameters—Part 7: Measurement of activity dips of quartz crystal units
GB Standard Chinese Title 石英晶体元件参数的测量 第7部分:石英晶体元件活性跳变的测量
Applicable Category China National-
Chinese Version Price $15 USD per 50 pages
English Translation Price About $15  per 1 page; Detail enquire us for
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Note The GB/T 22319.7-2015 standard english translation Prepayment unit $100 USD, is not mean this GB/T 22319.7-2015 standard english version price is $100 USD, it is only a basic unit of prepayment for translation, The actual translation fee and prepayment are depend on the amount of GB/T 22319.7-2015 standard Chinese words, We request 80% prepayment of the total translation fee.
For example, if the GB standard english price is $500, you need pay $400 prepayment, Four Quantities of the $100 prepayment unit.
  •  Relational standard of GB/T 22319.7-2015;    
  • Standard  Code GB Standard Title
  • GB/T 22319.9-2018
  • Measurement of quartz crystal unit parameters—Part 9:Measurement of spurious resonances of piezoelectric crystal units
  • GB/T 22319.11-2018
  • Measurement of quartz crystal unit parameters—Part 11:Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
  • GB/T 22319.7-2015
  • Measurement of quartz crystal unit parameters—Part 7: Measurement of activity dips of quartz crystal units
  • GB/T 22319.8-2008
  • Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
  • SJ/T 11212-1999
  • Measurement of quartz crystal unit parameters. Part 6: Measurement of drive level dependence (DLD)
  • SJ/T 11211-1999
  • Measurement of quartz crystal unit parameters. Part 5: Method for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
  • SJ/T 11210-1999
  • Measurement of quartz crystal unit parameters. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance Rland the calculation of other derived values of quartz crystal units, up to 30 MHz
  • SJ/Z 9154.3-1987
  • Basic method for measurement of network parameters at two ends of quartz crystal elements up to 200 MHz by phase technique in π-network with compensation of shunt capacitance CO
  • SJ/Z 9154.2-1987
  • Measurement of quartz crystal unit parameters by zero phase technique in a π-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
  • SJ/Z 9154.1-1987
  • Measurement of quartz crystal unit parameters by zero phase technique in a π-network. Part 1: Basic method for the measurement of resonance resistance and frequency of quartz crys
     
     

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