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 China "SJ/T 10745-1996" standard english version information:

1. China SJ/T 10745-1996 Standard Chinese version, you can purchase directly online; After receive your payment, we will send the GB Standards PDF file to your Email within 24 Hr.
2. China SJ/T 10745-1996 Standard English version is not ready-made,only after get your order, then we translate them, time usually need 3-5 days. Detail refere: "How to purchase the English version China GB Standards?"
Item Content
GB Standard  Code SJ/T 10745-1996
GB Standard Class China Electronics Standard
GB Standard English Title Mechanical and climatic test methods for semiconductor integrated circuits
GB Standard Chinese Title 半导体集成电路机械和气候试验方法
Applicable Category China Electronics-Electronics
Chinese Version Price $15 USD per 50 pages
English Translation Price About $15  per 1 page; Detail enquire us for
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China "SJ/T 10745-1996" Standard english version Add to Cart
Note The SJ/T 10745-1996 standard english translation Prepayment unit $100 USD, is not mean this SJ/T 10745-1996 standard english version price is $100 USD, it is only a basic unit of prepayment for translation, The actual translation fee and prepayment are depend on the amount of SJ/T 10745-1996 standard Chinese words, We request 80% prepayment of the total translation fee.
For example, if the GB standard english price is $500, you need pay $400 prepayment, Four Quantities of the $100 prepayment unit.
  •  Relational standard of SJ/T 10745-1996;    
  • Standard  Code GB Standard Title
  • GB/T 4937.4-2012
  • Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
  • GB/T 4937.3-2012
  • Semiconductor devices - Mechanical and climatic tests methods - Part 3: External visual examination
  • GB/T 18663.1-2008
  • Mechanical structures for electronic equipment Tests for IEC 60917 and IEC 60297 - Part 1: Climatic, mechanical tests and safety aspects for cabinets, racks, subracks and chassis
  • SJ/T 11379-2008
  • Plasma display panels. Part 4: Climatic and mechanical testing methods
  • GB/T 4937.2-2006
  • Semiconductor devices―Mechanical and climatic test methods―Part 2: Low air pressure
  • GB/T 4937.1-2006
  • Semiconductor devices―Mechanical and climatic test methods―Part 1: General
  • GB/T 19183.5-2003
  • Mechanical structures for electronic equipment--Outdoor enclosures--Part 3: Climatic,mechanical tests and safety aspects for cabinets and cases
  • GB/T 5095.6-1997
  • Electromechanical components for electronic equipment--Basic testing proceduresand measuring methods--Part 6:Climatic tests and soldering tests
  • GB/T 5095.11-1997
  • Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 11:Climatic tests
  • SJ/T 10745-1996
  • Mechanical and climatic test methods for semiconductor integrated circuits
     
     

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