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China monocrystal GB Standards Search System


GB standards are the China national standards; Prefix code GB are Mandatory standards, GB/T are Recommended standards; All products or service must be compliance with GB standards; If you want to export products or services to huge Chinese market, need ensure they are meet the requirements of GB china national standards;  We provide Chinese GB standards and English version GB standards  Lookup, Translate, Download, Imported Commodity GB standards Testing and Compliance review services.
  •  China "monocrystal" GB Standards List:
  • Standard  Code GB Standard Title Standard Class Order
  • GB/T 34481-2017
  • Test method for measuring etch pit density (EPD) in low dislocation density monocrystalline germanium slices monocrystal
    China National Standards
  • GB/T 35305-2017
  • monocrystalline gallium arsenide polished wafers for solar cell monocrystal
    China National Standards
  • GB/T 32278-2015
  • Test methods for flatness of monocrystalline silicon carbide wafers monocrystal
    China National Standards
  • GB/T 12962-2015
  • monocrystalline silicon monocrystal
    China National Standards
  • SJ/T 11499-2015
  • Test method for measuring electrical properties of monocrystalline silicon carbide monocrystal
    China Electronics Standards
  • SJ/T 11504-2015
  • Test method for measuring surface quality of polished monocrystalline silicon carbide monocrystal
    China Electronics Standards
  • SJ/T 11500-2015
  • Test method for measuring crystallographic orientation of monocrystalline silicon carbide monocrystal
    China Electronics Standards
  • SJ/T 11501-2015
  • Test method for determining crystal type of monocrystalline silicon carbide monocrystal
    China Electronics Standards
  • SJ/T 11503-2015
  • Test methods for measuring surface roughness of polished monocrystalline silicon carbide wafers monocrystal
    China Electronics Standards
  • SJ/T 11502-2015
  • Specification for polished monocrystalline silicon carbide wafers monocrystal
    China Electronics Standards
  • GB/T 30656-2014
  • Polished monocrystalline silicon carbide wafers monocrystal
    China National Standards
  • GB/T 31351-2014
  • Nondestructive test method for micropipe density of polished monocrystalline silicon carbide wafers monocrystal
    China National Standards
  • GB/T 31093-2014
  • Test method for stress of monocrystalline sapphire ingot monocrystal
    China National Standards
  • GB/T 31092-2014
  • monocrystalline sapphire ingot monocrystal
    China National Standards
  • GB/T 30868-2014
  • Test method for measuring micropipe density of monocrystalline silicon carbide wafers鈥旵hemically etching monocrystal
    China National Standards
  • GB/T 30866-2014
  • Test method for measuring diameter of monocrystalline silicon carbide wafers monocrystal
    China National Standards
  • GB/T 30867-2014
  • Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers monocrystal
    China National Standards
  • GB/T 29504-2013
  • 300mm monocrystalline silicon monocrystal
    China National Standards
  • GB/T 29506-2013
  • 300mm polished monocrystalline silicon wafers monocrystal
    China National Standards
  • GB/T 29508-2013
  • 300mm monocrystalline silicon as cut slices and grinded slices monocrystal
    China National Standards
  • GB/T 26074-2010
  • Germanium monocrystal-measurement of resistivity-DC linear four-point probe monocrystal
    China National Standards
  • GB/T 25076-2010
  • monocrystalline silicon of solar cell monocrystal
    China National Standards
  • JJF 1256-2010
  • Calibration specification for X-ray monocrystal orientation equipment monocrystal
    China Metrological Standards
  • GB/T 5238-2009
  • monocrystalline germanium and monocrystalline germanium slices monocrystal
    China National Standards
  • GB/T 1551-2009
  • Test method for measuring resistivity of monocrystal silicon monocrystal
    China National Standards
  • GB/T 5252-2006
  • Germanium monocrystal - inspection of dislocation etch pit density monocrystal
    China National Standards
  • GB/T 12965-2005
  • monocrystalline silicon as cut slices and lapped slices monocrystal
    China National Standards
  • GB/T 19199-2003
  • Test method for carbon concentration of semi-insulating monocrystal gallium arsenide by measurement infrared absorption method monocrystal
    China National Standards
  • GB/T 12964-2003
  • monocrystalline silicon polished wafers monocrystal
    China National Standards
  • QB/T 1173-2002
  • monocrystal rock sugar monocrystal
    China Light Industry Standards
  • SJ 20844-2002
  • Test method for microzone homogeneity of semi-insulating monocrystal gallium arsenide monocrystal
    China Electronics Standards
  • SJ 20658-1998
  • Specification for radiation hardened monocrystal silicon wafers for military CMOS integrated circuits monocrystal
    China Electronics Standards
  • GB/T 17170-1997
  • Test method for deep level EL2 concentration of undoped semiinsulating monocrystal gallium arsenide by measurement infra-red absorption method monocrystal
    China National Standards
  • GB/T 13843-1992
  • Polished monocrystalline sapphire substrates monocrystal
    China National Standards
  • SJ 2572-1985
  • (monocrystalline silicon solar cells with bars, sheets) monocrystal
    China Electronics Standards
  • SJ/T 2429-1983
  • Test method for electrical characteristics of astronautic monocrystal silicon solar cells monocrystal
    China Electronics Standards
  • SJ/T 2428-1983
  • Clibration for astronautic standard monocrystal silicon solar cells monocrystal
    China Electronics Standards

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