GB/T 44517-2024
China national
standard english version:
GB
中华人民共和国国家标准
NATIONAL
STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 44517-2024
Microelectromechanical systems (MEMS) technology - Wafer curvature and cantilever beam deflection test methods for residual stress of MEMS membranes 微机电系统(MEMS)技术-MEMS膜残余应力的晶圆曲率和悬臂梁挠度试验方法
Issued Date:2024/9/29
Implemented Date:2025/4/1
Issued by:
The Standardization Administration of the People's Republic of China