Standard Code | Standard Title | Standard Class | Order |
---|---|---|---|
GB/T 26070-2010 |
Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method 化合物半导体抛光晶片亚表面损伤的反射差分谱测试方法 |
China National Standards Characterization subsurface damage |
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