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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 43897-2024 |
Casting high-temperature alloys - Master alloys - Single crystals {译} 铸造高温合金-母合金-单晶 |
China National Standards crystals |
 English PDF |
| GB/T 43726-2024 |
Test methods for single liquid crystals {译} 无刷直流力矩电动机通用技术条件 |
China National Standards crystals |
English PDF |
| GB/T 43610-2023 |
Microbeam analysis Analytical electron microscopy Transmission electron microscopy method for determination of apparent growth direction of linear crystals {译} 微束分析 分析电子显微术 线状晶体表观生长方向的透射电子显微术测定方法 |
China National Standards crystals |
English PDF |
| GB/T 43263-2023 |
Nanotechnology Characterization methods of cellulose nanocrystals {译} 纳米技术 纤维素纳米晶的表征方法 |
China National Standards crystals |
English PDF |
| GB/T 43012-2023 |
Determination of sulfur element and sulfate half-ester content in pulp cellulose nanocrystals {译} 纸浆 纤维素纳米晶体中硫元素和硫酸半酯含量的测定 |
China National Standards crystals |
English PDF |
| GB/T 42676-2023 |
Testing the quality of semiconductor single crystals X-ray diffraction method {译} 半导体单晶晶体质量的测试 X射线衍射法 |
China National Standards crystals |
English PDF |
| GB/T 10067.417-2023 |
Basic specifications for electrothermal and electromagnetic treatment devices Part 417: Devices for growing silicon carbide single crystals {译} 电热和电磁处理装置基本技术条件 第417部分：碳化硅单晶生长装置 |
China National Standards crystals |
English PDF |
| GB/T 42263-2022 |
Determination of nitrogen content in silicon single crystals - Secondary ion mass spectrometry {译} 硅单晶中氮含量的测定 二次离子质谱法 |
China National Standards crystals |
English PDF |
| GB/T 40291-2021 |
Nuclear instrumentation—High-purity germanium crystals for radiation detectors—Measurement methods of basic characteristics 核仪器仪表 辐射探测器用高纯度锗晶体 基本特性的测量方法 |
China National Standards crystals |
English PDF |
| GB/T 39865-2021 |
Method for measuring refractive index of uniaxial optical crystals 单轴晶光学晶体折射率测量方法 |
China National Standards crystals |
English PDF |
| GB/T 20724-2021 |
Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction 微束分析 薄晶体厚度的会聚束电子衍射测定方法 |
China National Standards crystals |
English PDF |
| GB/T 37418-2019 |
Lutetium oxyorthosilicate, lutetium-yttrium oxyorthosilicate scintillation single crystals 硅酸镥、硅酸钇镥闪烁单晶 |
China National Standards crystals |
English PDF |
| GB/T 34612-2017 |
Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals 蓝宝石晶体X射线双晶衍射摇摆曲线测量方法 |
China National Standards crystals |
English PDF |
| GB/T 19199-2015 |
Test method for carbon acceptor concentration in semi-insulating gallium arsenide single crystals by infrared absorption spectroscopy 半绝缘砷化镓单晶中碳浓度的红外吸收测试方法 |
China National Standards crystals |
English PDF |
| GB/T 17170-2015 |
Test method for the EL2 deep donor concentration in semi-insulating gallium arsenide single crystals by infrared absorption spectroscopy 半绝缘砷化镓单晶深施主EL2浓度红外吸收测试方法 |
China National Standards crystals |
English PDF |
| GB/T 9532-2012 |
Designations for piezoelectric crystals 压电单晶材料型号命名方法 |
China National Standards crystals |
English PDF |
| GB/T 11072-2009 |
Indium antimonide polycrystal,single crystals and as-cut slices 锑化铟多晶、单晶及切割片 |
China National Standards crystals |
English PDF |
| GB/T 24370-2009 |
Characterization of CdSe quantum dot nanocrystals - UV-Vis absorption spectroscopy 硒化镉量子点纳米晶体表征 紫外-可见吸收光谱方法 |
China National Standards crystals |
English PDF |
| GB/T 11093-2007 |
Liquid encapsulated czochralski - grown gallium arsenide single crystals and as-cut slices 液封直拉法砷化镓单晶及切割片 |
China National Standards crystals |
English PDF |
| GB/T 4326-2006 |
Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient 非本征半导体单晶霍尔迁移率和霍尔系数测量方法 |
China National Standards crystals |
English PDF |
| GB/T 16864-1997 |
Method for testing cryogenic transmissivityof crystals 低温下晶体透射率的试验方法 |
China National Standards crystals |
English PDF |
| GB/T 16863-1997 |
Method for testing refractive index of crystals 晶体折射率的试验方法 |
China National Standards crystals |
English PDF |
| GB/T 12634-1990 |
Test methods for electroelastic constants of piezoelectric crystals 压电晶体电弹常数测试方法 |
China National Standards crystals |
English PDF |
| GB/T 12633-1990 |
Terms for the measurements of the properties of the piezoelectric crystals 压电晶体性能测试术语 |
China National Standards crystals |
English PDF |
| GB/T 11312-1989 |
Test methods for SAW properties of piezoelectric ceramics and crystals 压电陶瓷材料和压电晶体声表面波性能测试方法 |
China National Standards crystals |
English PDF |
| GB/T 11297.7-1989 |
Test method for resistivity and hall coefficient indium antimonide single crystals 锑化铟单晶电阻率及霍耳系数的测试方法 |
China National Standards crystals |
English PDF |
| GB/T 6627-1986 |
Designations for lumbered synthetic quartz crystals 人造石英晶体棒材型号命名方法 |
China National Standards crystals |
English PDF |
| GB/T 3351-1982 |
Designations for synthetic quartz crystals 人造石英晶体的型号命名 |
China National Standards crystals |
English PDF |
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