Standard Code | Standard Title | Standard Class | Order |
---|---|---|---|
GB/T 26068-2018 |
Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method 硅片和硅锭载流子复合寿命的测试-非接触微波反射光电导衰减法 |
China National Standards ingots—Non |
![]() English PDF |
Find out:1Items | To Page of: First -Previous-Next -Last | 1 |