China 'GB/T 45770-2025
' standard english version:
NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 45770-2025
Surface Chemical Analysis - Atomic Force Microscopy - In-situ Characterization Procedure for Atomic Force Microscope Probe Shank Profile for Nanostructure Measurement 表面化学分析-原子力显微术-用于纳米结构测量的原子力显微镜探针柄轮廓原位表征程序
Issued Date:2025/6/30
Implemented Date:2026/1/1
Issued by:
The Standardization Administration of the People's Republic of China