China 'GB/T 20176-2025
' standard english version:
NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 20176-2025
Surface Chemical Analysis - Secondary Ion Mass Spectrometry - Determination of Atomic Concentration of Boron in Silicon Using a Uniformly Doped Material 表面化学分析-二次离子质谱-用均匀掺杂物质测定硅中硼的原子浓度
Issued Date:2025/6/30
Implemented Date:2026/1/1
Issued by:
The Standardization Administration of the People's Republic of China
GB Standard Code
GB/T 20176-2025
Standard Category
China National
Standards
GB Standard English Title
Surface Chemical Analysis - Secondary Ion Mass Spectrometry - Determination of Atomic Concentration of Boron in Silicon Using a Uniformly Doped Material
GB Standard Chinese Title
表面化学分析-二次离子质谱-用均匀掺杂物质测定硅中硼的原子浓度
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