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GB standards are the China national standards; Prefix code GB are Mandatory standards, GB/T are Recommended standards; All products or service must be compliance with GB standards; If you want to export products or services to huge Chinese market, need ensure they are meet the requirements of GB china national standards; We provide Chinese GB standards and English version GB standards Lookup, Translate, Download, Imported Commodity GB standards Testing and Compliance review services. |
| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 42907-2023 |
Testing of non-equilibrium carrier recombination lifetime in silicon ingots, silicon blocks and silicon wafers Non-contact eddy current induction method 硅锭、硅块和硅片中非平衡载流子复合寿命的测试 非接触涡流感应法 |
China National Standards lifetime |
 English PDF |
| GB/T 1553-2023 |
Determination of minority carrier lifetime in silicon and germanium Photoconductivity decay method 硅和锗体内少数载流子寿命的测定 光电导衰减法 |
China National Standards lifetime |
English PDF |
| GB/T 40116-2021 |
Foil bearings - Performance of hydrodynamic gas journal bearings - Testing of static load capacity, friction coefficient and lifetime 箔片轴承 气体动压径向轴承性能 静态承载能力、摩擦因数和寿命测试 |
China National Standards lifetime |
English PDF |
| GB/T 38914-2020 |
Evaluation method for lifetime of proton exchange membrane fuel cell stack in vehicle application 车用质子交换膜燃料电池堆使用寿命测试评价方法 |
China National Standards lifetime |
English PDF |
| GB/T 26068-2018 |
Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method 硅片和硅锭载流子复合寿命的测试-非接触微波反射光电导衰减法 |
China National Standards lifetime |
English PDF |
| GB/T 26068-2010 |
Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance 硅片载流子复合寿命的无接触微波反射光电导衰减测试方法 |
China National Standards lifetime |
English PDF |
| GB/T 1553-2009 |
Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay 硅和锗体内少数载流子寿命测定光电导衰减法 |
China National Standards lifetime |
English PDF |
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