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GB/T 42907-2023
Standard English Version


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NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA

GB/T 42907-2023

 

Testing of non-equilibrium carrier recombination lifetime in silicon ingots, silicon blocks and silicon wafers Non-contact eddy current induction method
硅锭、硅块和硅片中非平衡载流子复合寿命的测试 非接触涡流感应法

 
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Issued by:   The Standardization Administration of the People's Republic of China
 

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