![]() Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films 表面化学分析 深度剖析 用单层和多层薄膜测定X射线光电子能谱、俄歇电子能谱和二次离子质谱中深度剖析溅射速率的方法 |
![]() Information and documentation—RFID in libraries—Part 3:Encoding of data elements based on rules from ISO/IEC 15962 in an RFID tag with partitioned memory 信息与文献 图书馆射频识别(RFID) 第3部分:分区存储RFID标签中基于ISO/IEC 15962规则的数据元素编码 |
![]() Determination of SiO2,Al2O3,Fe2O3,K2O,Na2O,CaO,MgO content of soda-lime-silica glass by X-ray fluorescence spectrometric method X射线荧光光谱法测定钠钙硅玻璃中SiO2、Al2O3、Fe2O3、K2O、Na2O、CaO、MgO含量 |
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