CNS 13781:1996
EnduranCe Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法 預燒試驗(順向偏壓) |
CNS 524:1955
Plug gauge for Whitworth thread (no go end limit for fine,medium and Coarse fits) 韋氏螺紋量柱(不通過端限界尺寸,精配,中配及粗配) |
CNS 526:1955
Ring gauge for Whitworth thread (go end limit for fine, medium and Coarse fits) 韋氏螺紋樣圈(通過端限界尺寸,精配,中配及粗配) |
CNS 538:1955
InspeCtion plug gauge for metric thread ring gauge (go end limit, fine, medium and coarse fits) 公制螺紋樣圈之量柱及磨損量柱(通過端,精配,中配及粗配) |
CNS 13798-2:1996
Banking - Personal IdentifiCation Number Management and 銀行業-個人識別碼管理與安全(第二部:認可的個人識別碼加密演算法) |
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