GB 7251.1-2013
Low-voltage switchgear and controlgear assemblies―Part 1: General rules 低压成套开关设备和控制设备 第1部分:总则 |
GB/T 14863-2013
Method for net carrier density in silicon epitaxial layers by voltage-capacitance of gated and ungated diodes 用栅控和非栅控二极管的电压电容关系测定硅外延层中净载流子浓度的方法 |
GB 7251.12-2013
Low-voltage switchgear and controlgear assemblies—Part 2: Power switchgear and controlgear assemblies 低压成套开关设备和控制设备 第2部分:成套电力开关和控制设备 |
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