SJ/T 11210-1999
Measurement of quartz crystal unit parameters. Part 4: Method for the measurement of the load resonance frequency fL, load resonance Resistance Rland the calculation of other derived values of quartz crystal units, up to 30 MHz 石英晶体元件参数的测量 第4部分:频率达30mhz石英晶体元件负载谐振频率fl和负载谐振电阻rl的测量方法及其他导出参数的计算 |
GB/T 5095.15-1997
Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 15:Mechanical tests on contacts and terminations--Section 8:Test 15h--Contact retention system Resistance to tool application 电子设备用机电元件 基本试验规程及测量方法 第15部分:接触件和引出端的机械试验 第八篇:试验15h接触件固定机构耐工具使用性 |
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